Workshop 2011

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Bruker/NYU X-ray Powder Diffraction Workshop
Department of Chemistry, New York University
June 15-16, 2011

Over the past decade, the advancement of X-ray diffraction instrumentation and methods has elevated research in academic, industrial, and government labs. Innovations in X-ray detector technology, particularly two-dimensional area detectors, have played an important role in expanding the utility of X-ray diffraction. The Bruker/NYU Diffraction Workshop and its accompanying Master Class will span two days at New York University, with lectures as well as hands-on training on a state-of-the-art Bruker GADDS microdiffractometer and other Bruker X-ray instruments. The Workshop will include lectures from various academic, government, and industrial organizations with a wide range of experience in X-ray diffraction and its applications. The hands-on Master Class will be taught by Bruker scientists and NYU personnel. Faculty, undergraduate and graduate students, postdocs, and industrial scientists are invited to register. Attendees are encouraged to bring samples of interest to the workshop for the hands-on training Master Class, and scientific problems to the round-table discussion. 

Confirmed invited speakers and instructors

• Simon Billinge, Columbia University/Brookhaven National Laboratory, NY
  
• James Britten, McMaster University, Canada
  
• Bob Baoping He, Bruker AXS, Madison, WI
  
• Chunhua Tony Hu, New York University, NY
  
• Qi Jiang, New York University, NY
  
• Daniele Musumeci, New York University, NY
  
• Scott Speakman, MIT, MA
  
• Michael D. Ward, New York University, NY
  
• Wenqian Xu, Brookhaven National Laboratory, NY 
  
• Shawn Xiaotian Yin, Bristol-Myers Squibb, NJ
  
• Lian Yu, University of Wisconsin-Madison, WI
  

Aim

• To introduce the state-of-the-art Bruker AXS Discover GADDS with 2D VÅNTEC detector 
  
• To learn the basics of the X-ray powder diffraction
  
• To check suitable applications to promote your research
  
• To receive hands-on training on the operation of the instrument and data analysis
  

Topics

• Basics on X-ray Diffraction and the instrumentation with two-dimensional detector
  
• Sample preparation, phase identification, and quantitative analysis
  
• Texture analysis, crystallite size measurement, and small-angle scattering
  
• Total scattering and atomic pair distribution function method
  

Three sessions 
•    Oral presentations in both mornings 
•    Hands-on training Master Classes in both afternoons 
•    Round-table discussions in both afternoons 
Prizes 
Two quiz prizes provided by Bob Baoping He, of Bruker AXS 
Registration 
Registration is free. 
The number of participants in the Workshop (lectures) is limited to 50. 
The Master Class component is limited to 16, so register early. 
Please register by providing the following information to Tony Hu at chunhua.hu@nyu.edu no later than Monday, June 6, 2011: 
-- 
Full name: 
Affiliation: 
Group advisor:
Email address: 
Phone number: 
Lectures: Yes/No 
Round-table discussion: Yes/No 
Master Class: Yes/No 
Will you bring a sample for the Master Class? (Maximum of one sample): Yes/No 
If yes, please describe the sample (briefly): 
-- 
You will receive a confirmation email about your registration within three days after receipt. 
Location 
The registration, workshop, and master classes will be held in the Silver Complex, on the east side of Washington Square Park. For directions to NYU and the Silver Complex go to http://www.nyu.edu/about/visitor-information/getting-to-nyu.html. Enter the Silver Complex at 32 Waverly Place, just east of the corner of Washington Square East and Waverly Place. You will need to present a photo ID to security, who will direct you to the 1003 Silver (10th floor). Drivers can park in the garage located on the Mercer Street.
Organizing Committee 
•    Michael D. Ward, Chunhua Tony Hu, New York University 
•    Bob Baoping He, Amy Mirchandani, Ray Matejczyk, Bruker AXS 
Sponsors 
•    Bruker AXS
•    Materials Research Science and Engineering Center, New York University
•    Department of Chemistry, New York University
Acknowledgement 
We thank the support by the National Science Foundation under Award Numbers CRIF/CHE-0840277 and by the NSF MRSEC Program under Award Number DMR-0820341.
Agenda