Microscopes
Location: Silver 721A
MERLIN (Carl Zeiss) field emission scanning electron microscope (FESEM): The Merlin FESEM features standard detectors, ‘SE2’ (Everhart-Thornley type) and ‘in lens’ (annular secondary electron). The Merlin also includes an in lens EsB detector with filtering grid, offering energy and angle-selective backscattered electron imaging for highest material contrast. It also includes the multi-segment, Si diode-based CZ BSD back scattered electron detector. X-ray microanalysis is available using the Oxford Instruments EDS with integrated INCA software. In addition to SEM, the Merlin includes STEM detection for high resolution images of TEM samples. The column also offers high resolution imaging at low acceleration voltages and low beam currents.
Technical data: resolution (optimal WD) = 0.8 nm @ 15 kV, 1.4 nm @ 1 kV, 0.6 nm @ 30 kV (STEM mode); magnification = 12 – 2,000,000 x in SE mode; 5-axis motorized stage, –3 to 70 tilt; chamber volume = 330 mm (Ø) x 270 mm (h); local charge compensation device (stainless steel needle injects nitrogen gas into the region of interest); image resolution up to 6144 x 4608 pixels.
The Merlin FESEM was acquired through the support of the MRI program of the National Science Foundation under Award Number DMR-0923251.
Please visit the Electron Microscopy Facility web page for more information.
Location: Silver 721B
The Leica TCS SP8 X Laser Confocal Microscope setup includes two super-sensitive GaAsP hybrid detectors (with quantum efficiency twice as much as a standard PMT) and the state-of-the-art White Light Laser (WLL) source that can virtually output any wavelength from 470 to 670 nm. Up to eight lines can be used simultaneously. The WLL source that can perfectly match the wavelength of virtually any fluorophore. By tuning both excitation and detection, complete excitation emission spectra can be acquired. With this spectral information, any dye can be optimally excited with minimum cross-excitation and specimen damage. As a consequence the choice of fluorescent labels is not limited any longer by the hardware. Another unique benefit of equipping the Leica TCS SP8 X with a WLL source is the ability of using an adjustable time gate to switch off the data collection during the white light laser pulse. This clever, filter-free method to remove unwanted signal from the image data produces the highest image contrast without any reflection. The Microscope set-up also includes a digital color camera Leica DFC310 FX, which provides images of fluorescence-labeled specimens with high color fidelity. Active cooling of sensor elements using a Peltier element creates noise-free images even at the lowest light intensities. Various acquisition modes such as binning allow for the precise monitoring of fast dynamic processes. The extremely high scanning frequency allows efficient documentation of 3D moving objects at full camera resolution. The camera delivers up to 71 images per second in 4 x 4 binning mode. The top scan rate allows fast focusing using the monitor and perfect parameter adjustment. At the same time, specimen photobleaching is avoided. Recording also can be performed in high-resolution mode.
This instrument was purchased with a combination of MRSEC and departmental funds (Prof. Stefano Sacanna startup).
Location: Brown 357
The Thermo Scientific DXR Raman microscope provides point and shoot Raman microscopy with exceptional sensitivity and spatial resolution. The microscope is equipped with two excitation lasers of wavelengths 780 nm and 532 nm, a full range grating (50-3500 cm-1 for 532 nm, 50-3300 cm-1 for 780 nm) and a high resolution grating(50-1800 cm-1 for both). The spectral resolution is 5.0 cm-1 for the full range and 2.0 cm-1 for the high resolution. The microscope is equipped with four long working distance Olympus objectives, 10X, 20X, 50Xand 100X and Brightfield/Darkfield illuminator. It also has a macro sampling adapter accessory that allows measurement on samples dissolved in solution. OMNIC Atlμs software provides hyperspectral mapping capability and image analysis.